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The fab’s yield is now a model’s output

07:05 ISTby Yethikrishna R

the fab’s yield is now a model’s output: ai visual inspection pushed some lines from mid-60s to 95 percent, and tsmc’s digital twin cut yield-prediction error from 12 to 3 percent by finding a defect link seven layers apart that no engineer had connected. samsung runs agentic ai across hbm4e. the wafer’s defect list is now machine-generated.

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